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J. Großmann, M. Conrad, I. Fey, A. Krupp, K. Lamberg, C. Wewetzer:
TestML – A Test Exchange Language for Model-based Testing of Embedded Software

Vorgetragen auf dem Automotive Workshop San Diego 2006 (ASESD2006)

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Abstract:
Test processes in the automotive industry are tool-intensive and af-fected by technologically heterogeneous test infrastructures. In the industrial practice a product has to pass several test levels such as Model-in-the-Loop- (MIL), Software-in-the-Loop- (SIL) and Hardware-in-the-Loop- (HIL) tests. Normally, different test systems are applied for this purpose and almost each test system has its individual requirements on the test description and often re-quests a proprietary test description language. As a result, whole test specifica-tions are created as an assembly from a variety of different description lan-guages. Efforts to integrate these heterogeneous specifications, to address test exchange in a general manner and to standardize and harmonize the existing language environment are still at the beginning and not tailored towards the re-quirements of the automotive domain. To keep the whole development and test process efficient and manageable, the definition of an integrated and seamless approach is required. TestML – the test exchange language presented in this contribution – is defined to overcome the technological obstacles that almost automatically accompany the application of heterogeneous test tools and test in-frastructures. TestML supports the exchange of different test notations in a het-erogeneous tool environment. By defining an XML-based interchange format spanning different tools, TestML offers a common basis. Individual, tool-specific notations can be mapped here through the realization of appropriate import/export adapters. In this paper, we introduce the XML schema of TestML and demonstrate the efficiency of the interchange format by giving examples from the model-based development of electronic control units.